SNDM can perform "Quantitative Measurement of Dielectric Properties".
SNDM measure the capacitance change just under the needle tip as the resonance frequency shift of LC resonance circuit.
Thus, the quantitative measurement is achieved by calculating the relationship between "Resonance Frequency", "Capacitance Change" and "Dielectric constant".
The relationship between "Resonance Frequency" and "Capacitance Change" is as follows.
On the other hand, the relationship between "Capacitance just under the needle" and "Linear Dielectric Constant of Specimen" is as follows.
Thus, the relationship between "Resonance Frequency" and "Linear Dielectric Constant of Specimen" is as follows.
In this equation, the unknown parameter is the function of tip radius a and float capacitance C0 (Probe Constant). Therefore, in order to obtain this constant, the SNDM measurement of the standard specimen (which is known of the linear dielectric constant) is required.
The experimental results of quantitative measurement of linear dielectric constant as follows.
In case of the cantilever type SNDM, please refer to "Jpn. J. Appl. Phys., Vol.41(2002)4961".
In the similar way of Quantitative Measurement Method of Linear Dielectric Constant, the quantitative measurement is achieved by calculating the relationship between "Resonance Frequency Deviation", "Capacitance Change" and "Nonlinear Dielectric constant".
The relationship between "Resonance Frequency Deviation" and "Capacitance Variation" is as follows.
On the other hand, the relationship between "Capacitance Deviation caused by the electric field" and "Nonlinear Dielectric Constant of Specimen" is as follows.
Thus, the relationship between "Resonance Frequency Deviation" and "Nonlinear Dielectric Constant of Specimen" is as follows.
The experimental results of quantitative measurement of nonlinear dielectric constant as follows.
This method is also applicable even in the cantilever type SNDM.